Metrology module from 4D Technology provides sub-nanometer vertical resolution
Sept. 3, 2015
The FlexCam is a compact, high-resolution 3D metrology system for in situ roll-to-roll measurement of flexible electronics. The modules provide sub-nanometer vertical resolution and micron-scale lateral resolution for in-process roughness and defect quantification for measurement of substrates, barrier films, and intermediate layers.
4D Technology
Tucson, AZ
www.4dtechnology.com
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