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    • Applied Research & Photonics Inc

    Harrisburg, PA 17111

    COMPANY OVERVIEW

    About Applied Research & Photonics Inc

    Contact

    470 Friendship Rd
    Suite 10
     Harrisburg, PA 17111
    United States
    http://www.arphotonics.net
    717-220-1003
    717-566-1177

    More Info on Applied Research & Photonics Inc

    Manufacturer of terahertz line of instruments. TeraSpectra: spectrometer; TeraScanR: skin scanner; nano-scanner for wafer defect inspection; terahertz dynamic analyzer for ballistic analysis

    Articles

    FIGURE 1. For the terahertz nanoscanner setup, both reflection- and transmission-mode measurements are possible (a). The sample remains stationary while the nanoscanner scans the sample over a chosen area or volume. Here, an optical wafer is mounted on the terahertz nanoscanner to prepare for imaging (b).
    Detectors & Imaging

    Spectroscopic terahertz imaging probes the inner structures of 0D-3D nanomaterials

    Anis Rahman
    Terahertz time-domain scanning technology provides camera-less, lattice-resolution, layer-by-layer imaging and identification of the internal structures of simple and complex ...
    Content Dam Lfw Print Articles 2018 10 1810lfw Nb F4
    Test & Measurement

    Terahertz multispectral reconstructive 3D imaging performs nanoscale metrology

    Gail Overton
    Nondestructive, noncontact terahertz imaging can overcome the Abbe diffraction limit and perform nanoscale measurement of semiconductor structures, even in three dimensions.
    Content Dam Lfw Print Articles 2015 12 1512lfw Nb 1
    Test & Measurement

    Terahertz reflectometry nondestructively inspects foil seals

    Gail Overton
    A nondestructive and noncontact terahertz scanner can perform foil seal inspection with high specificity and accuracy.
    Content Dam Lfw Print Articles 2014 09 1409lfwnbf1web
    Test & Measurement

    Terahertz reflectometry identifies early skin cancer

    Gail Overton
    Applied Research & Photonics (ARP) is applying its terahertz-reflectometry systems—which have also been used for multilayer paint-thickness analysis and fault detection in silicon...
    (Image credit: Applied Research and Photonics)
    A 3D image of a small patch of painted surface sensed by terahertz reflectometry shows that the paint is nonuniform, consisting of four different layers.
    Test & Measurement

    Terahertz reflectometry characterizes coats of paint without damaging them

    A father-and-son research team at Applied Research and Photonics (Harrisburg, PA) has developed a technique that uses terahertz reflectometry to measure the thickness of paint...
    (Courtesy ARP)
    A terahertz scanner from Applied Research & Photonics (ARP) is able to scan the intricate patterns on a wafer undergoing the fabrication process for defects.
    Test & Measurement

    Terahertz wafer scanner from ARP detects chip defects down to 1 nm

    Harrisburg, PA--A terahertz wafer scanner from ARP detects chip defects down to 1 nm, decreasing rejects in wafer fabrication.
    FIGURE 1. An experimental setup shows the terahertz scanning reflectometer. A fine-pitch, one-dimensional motion control system is used to move the substrate (sample holder) in and out of the focal point while the detection system acquires data in real time. For kinetics measurements, the specimen is kept fixed and focused.
    Research

    TERAHERTZ INSTRUMENTATION: Terahertz technology enables systems for molecular characterization

    Anis Rahman
    Smart terahertz scanning reflectometer and spectrometer systems exploit the ability of terahertz radiation to penetrate nonmetallic objects and sense the motions of molecules....

    KEY CONTACTS

    Anis Rahman

    CTO and President, Applied Research & Photonics (ARP)

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    CLEO/Laser Focus World INNOVATION AWARDS: Terahertz scanning reflectometer from Applied Research & Photonics takes top award

    Gail Overton
    The 2011 CLEO/Laser Focus World Innovation Awards program is designed to honor groundbreaking products in the field of photonics and laser science.