Detectors & Imaging

Zeiss laser FIB-SEM microscope integrates a femtosecond laser

May 25, 2020

The Crossbeam Laser family are site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages. It integrates a femtosecond laser for speed, a gallium ion (Ga⁺) beam, and SEM for nanoscale-resolution imaging with minimal sample damage.

Zeiss

Oberkochen, Germany

www.zeiss.com/pcs

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