Croissy-Beaubourg, France, December 10, 2002 . CEDIP Infrared Systems has announced a new camera designed to meet the demanding infrared analysis requirements of spectroscopic test equipment for telecommunication and process monitoring applications.
The JADE SWIR camera is sensitive from 0.8 - 2.5 microns and uses a MCT based focal plane array sensor cooled with a thermoelectric cooler to provide extremely high sensitivity and hence to capture in real-time high-speed dynamic events in snapshot readout mode. With a maximum quantum efficiency of 70% at 2.5 µm the JADE SWIR camera offers uniquely strong performance at longer wavelengths.
The JADE SWIR can operate up to 100 frames per second at full image size (320Hx256V) with output digitized over a complete 14-bits dynamic range.
Coupled with CEDIP's PC-based analysis and reporting software ALTAIR, the system provides engineers with a cost effective solution for obtaining accurate thermal measurements in the most challenging test situations.
CEDIP Infrared systems design and manufacture a full range of infrared systems dedicated to temperature measurement applications.
For more information, visit www.cedip-infrared.com .
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