The Nexview profiler, a 3D imaging and measurement system, is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. It provides sub-nanometer vertical resolution at all magnifications. Its Mx software produces high-fidelity surface topography maps for measuring roughness, flatness, angles, films, and steps.
Zygo
Middlefield, CT
www.zygo.com/nx
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LFW Staff
Published since 1965, Laser Focus World—a brand and magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.