Zygo introduces a profiler for 3D imaging and measurement

    Oct. 16, 2013
    The Nexview profiler is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough.
    10 Lfw 3 Zygo 5df3ca0c2ba03

    The Nexview profiler, a 3D imaging and measurement system, is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. It provides sub-nanometer vertical resolution at all magnifications. Its Mx software produces high-fidelity surface topography maps for measuring roughness, flatness, angles, films, and steps.
    Zygo
    Middlefield, CT
    www.zygo.com/nx

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