Zygo introduces a profiler for 3D imaging and measurement

Oct. 16, 2013
The Nexview profiler is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough.

The Nexview profiler, a 3D imaging and measurement system, is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. It provides sub-nanometer vertical resolution at all magnifications. Its Mx software produces high-fidelity surface topography maps for measuring roughness, flatness, angles, films, and steps.
Zygo
Middlefield, CT
www.zygo.com/nx

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