The Nexview profiler, a 3D imaging and measurement system, is optimized for noncontact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. It provides sub-nanometer vertical resolution at all magnifications. Its Mx software produces high-fidelity surface topography maps for measuring roughness, flatness, angles, films, and steps.
Zygo
Middlefield, CT
www.zygo.com/nx
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