Silicon CCD camera from Ophir has use in industrial laser beam profiling
Sept. 17, 2018
The SP920G GigE silicon CCD high-resolution camera is designed for high-speed industrial laser beam profiling applications. Supported by BeamGage beam analysis software, it captures and analyzes wavelengths from 190 to 1100 nm. It delivers 1624 × 1224 pixel resolution with a 4.4 μm pixel pitch for measuring beam widths of 44 μm to 5.3 mm.
Ophir (MKS Instruments)
North Logan, UT
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