Applied Research & Photonics Inc

Harrisburg, PA 17111

COMPANY OVERVIEW

About Applied Research & Photonics Inc

Contact

470 Friendship Rd
Suite 10
Harrisburg, PA 17111
United States
http://www.arphotonics.net
717-220-1003
717-566-1177

More Info on Applied Research & Photonics Inc

Manufacturer of terahertz line of instruments. TeraSpectra: spectrometer; TeraScanR: skin scanner; nano-scanner for wafer defect inspection; terahertz dynamic analyzer for ballistic analysis

Articles

FIGURE 1. For the terahertz nanoscanner setup, both reflection- and transmission-mode measurements are possible (a). The sample remains stationary while the nanoscanner scans the sample over a chosen area or volume. Here, an optical wafer is mounted on the terahertz nanoscanner to prepare for imaging (b).
Detectors & Imaging

Spectroscopic terahertz imaging probes the inner structures of 0D-3D nanomaterials

Terahertz time-domain scanning technology provides camera-less, lattice-resolution, layer-by-layer imaging and identification of the internal structures of simple and complex ...
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Test & Measurement

Terahertz multispectral reconstructive 3D imaging performs nanoscale metrology

Nondestructive, noncontact terahertz imaging can overcome the Abbe diffraction limit and perform nanoscale measurement of semiconductor structures, even in three dimensions.
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Test & Measurement

Terahertz reflectometry nondestructively inspects foil seals

A nondestructive and noncontact terahertz scanner can perform foil seal inspection with high specificity and accuracy.
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Test & Measurement

Terahertz reflectometry identifies early skin cancer

Applied Research & Photonics (ARP) is applying its terahertz-reflectometry systems—which have also been used for multilayer paint-thickness analysis and fault detection in silicon...
(Image credit: Applied Research and Photonics)
A 3D image of a small patch of painted surface sensed by terahertz reflectometry shows that the paint is nonuniform, consisting of four different layers.
Test & Measurement

Terahertz reflectometry characterizes coats of paint without damaging them

A father-and-son research team at Applied Research and Photonics (Harrisburg, PA) has developed a technique that uses terahertz reflectometry to measure the thickness of paint...
(Courtesy ARP)
A terahertz scanner from Applied Research & Photonics (ARP) is able to scan the intricate patterns on a wafer undergoing the fabrication process for defects.
Test & Measurement

Terahertz wafer scanner from ARP detects chip defects down to 1 nm

Harrisburg, PA--A terahertz wafer scanner from ARP detects chip defects down to 1 nm, decreasing rejects in wafer fabrication.
FIGURE 1. An experimental setup shows the terahertz scanning reflectometer. A fine-pitch, one-dimensional motion control system is used to move the substrate (sample holder) in and out of the focal point while the detection system acquires data in real time. For kinetics measurements, the specimen is kept fixed and focused.
Research

TERAHERTZ INSTRUMENTATION: Terahertz technology enables systems for molecular characterization

Smart terahertz scanning reflectometer and spectrometer systems exploit the ability of terahertz radiation to penetrate nonmetallic objects and sense the motions of molecules....
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Home

CLEO/Laser Focus World INNOVATION AWARDS: Terahertz scanning reflectometer from Applied Research & Photonics takes top award

The 2011 CLEO/Laser Focus World Innovation Awards program is designed to honor groundbreaking products in the field of photonics and laser science.

KEY CONTACTS

Anis Rahman

CTO and President, Applied Research & Photonics (ARP)

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