58620 Characterization Station Overview
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specifically designed for Laser Diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametric tests. When used in conjunction with Chroma's high capacity carrier, multiple devices can be rapidly indexed to improve not only test times but also repeatability which produces a large impact on yield and quality control. The Chroma 58620 is equipped with an ultra stable and uniform thermal control platform to incorporate R&D-style tests in a production environment.
Ultra Precise Carrier Design
From vast experience in the Semiconductor industry, Chroma introduces a precision and high capacity carrier which may be designed to accommodate a large array of mechanical form factors such as Chip on Carrier (CoC), Chip on Submount (CoS), Transistor Outline (TO), or Laser Bars. The highly innovative bi-lateral design's symmetry allows components to be placed on both sides allocating a larger batch of components. The carrier's multi-layer configuration allows for components to be easily inserted manually or by a robotic pick and place system. Surfaces and materials are engineered to optimize thermal contact to the device under test (DUT) allowing for efficient heat transference and a high level of temperature control. Once the carrier is inserted, the robotics take over and perform a wide-range of pre-defined automated tests on all devices (both sides) in the carrier.
ULTIMATE PRODUCTIVITY
Seamlessly integrates with Chroma’s 58602 and 58604 burn-in systems to reduce handling and increase yield.
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