This unique transmission configured interferometer provides real-time 3D quantitative phase measurements with unrivaled accuracy for characterizing transparent and semi-transparent...
Performs 3D, surface and topograhy measurements at two wavelengths simultaneously in real-time measurements with sub-nanmeter resolution and can be used for the dynamic characterization...
Cost-effective instruments providing real-time measurements of samples with sub-nanometer resolution for step heights up to 340 nm and suitable for in-plane and out-of-plane MEMS...
Three light sources allow two different simultaneous dual wavelengths for real-time measurements over the largest vertical range and with sub-nanometer resolution used also for...
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