Carl Zeiss, Digital Surf sign agreement for surface imaging software

Sept. 20, 2011
Thornwood, NY--Carl Zeiss and Digital Surf have signed an agreement that enables Carl Zeiss to provide ConfoMap surface imaging and analysis software for its confocal microscopes and compound microscopes for topographical research.

Thornwood, NY--Carl Zeiss and Digital Surf have signed an agreement that enables Carl Zeiss to provide ConfoMap surface imaging and analysis software for its confocal microscopes and compound microscopes for topographical research.

ConfoMap will provide research institutes and industrial facilities using Axio CSM 700, LSM 700 and other Carl Zeiss microscopes with the latest surface metrology standards and methods in order to develop and manufacture modern materials, says Dr. Franz Reischer, product manager of the Materials Business Unit at Carl Zeiss MicroImaging.

The standard ConfoMap ST package includes numerous analytical studies. Geometric studies calculate distances, angles, areas, volumes, and step heights on 2D profiles and 3D surfaces. Functional studies, including the bearing ratio curve and height distribution, facilitate the assessment of friction and wear on engineering surfaces. The roughness and waviness components of a surface are separated using the latest ISO 16610 advanced filtering techniques, and 3D surface texture parameters are calculated in accordance with ISO 25178 standard. Also, a layer on a micro-mechanical or electronic component can be extracted and analyzed in exactly the same way as a full surface.

Adding modules for advanced surface texture analysis, dimensional analysis, grain and particle analysis, 3D Fourier analysis, the analysis of surface evolution, and statistics can extend the ConfoMap ST software. A ConfoMap Premium package is also available.

Working in ConfoMap, a visual surface analysis report is built frame by frame in accordance with the latest international and national metrology standards and methods. Every analysis step is recorded in an analysis workflow to assure full metrological traceability.

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