MKS Ophir's BeamPeek beam analysis and power measurement system

Sept. 28, 2022

The Ophir® BeamPeek™ integrated beam analysis and power measurement system provides fast, accurate, real-time measurement of lasers in additive manufacturing chambers. The system provides simultaneous beam profiling, focal spot analysis, and power measurement in just three (3) seconds.

Sponsored Recommendations

March 31, 2025
Enhance your remote sensing capabilities with Chroma's precision-engineered optical filters, designed for applications such as environmental monitoring, geospatial mapping, and...
March 31, 2025
Designed for compatibility with a wide range of systems, Chroma's UV filters are engineered to feature high transmission, superior out-of-band blocking, steep edge transitions...
March 31, 2025
Discover strategies to balance component performance and system design, reducing development time and costs while maximizing efficiency.
March 31, 2025
Filter accessories including cubes, sliders, and rings, designed to enhance the performance and versatility of optical systems. These components ensure precise alignment and stability...