Eddy Co. optical monitoring system eliminates need for multiple test runs

The SpectraLock system provides in situ optical monitoring and deposition rate control to produce accurate single- and multilayered thin films. It measures optical thickness during coating and uses index dispersion enhanced optical monitoring to make sure coatings match specifications. It is designed to eliminate the need for multiple test runs during coating.

Eddy Co.

Apple Valley, CA

www.eddyco.com