The SpectraLock system provides in situ optical monitoring and deposition rate control to produce accurate single- and multilayered thin films. It measures optical thickness during coating and uses index dispersion enhanced optical monitoring to make sure coatings match specifications. It is designed to eliminate the need for multiple test runs during coating.
Eddy Co.
Apple Valley, CA
LFW Staff
Published since 1965, Laser Focus World—a brand and magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.