Diode-laser test system
The Automated Laser Characterization System tests and characterizes laser diodes automatically. The computer-controlled system measures a laser`s near-field and far-field and can measure wavelength spectrum using an optional spectrum analyzer. Power/voltage vs. current and other curves, which can be used to derive the laser`s threshold current, slope efficiency, and series resistance, can also be measured. The system uses MS-Windows-based software for positioning, test, alignment, and diagnostic system control. The entire measurement sequence takes less than 5 min.
E-Tek Dynamics, San Jose, CA
Sponsored Recommendations
Sponsored Recommendations
Working with Optical Density
Feb. 26, 2025
Finding the Right Dichroic Beamsplitter
Feb. 26, 2025
Measurement of Optical Filter Spectra
Feb. 26, 2025
Voice your opinion!
Voice your opinion!