CyberOptics vibration monitoring software measures vibrations of wafer transfers
AVS 2.0 vibration monitoring software provides engineers with the data needed to predict equipment failures related to vibration during semiconductor fabrication. It is designed to work with the Auto Vibration System (AVS), a wireless, wafer-like device that measures vibrations of wafer transfers in x, y, and z dimensions during semiconductor processes and fabrication.
CyberOptics Semiconductor
Wilsonville, OR
www.cyberopticssemi.com
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PRESS RELEASE
CyberOptics Semiconductor Vibration Monitoring Software
Offers New Capabilities For Data Analysis and Exportation
Vibration Software Filters Out Accepted Vibration Frequencies in Semi Process to Identify Anomalies
Wilsonville, Oregon, January 5, 2010 – CyberOptics Semiconductors (www.CyberOpticsSemi.com) introduces an updated release to its wafer vibration monitoring software, offering new capabilities for data analysis and third party data interfaces. With vibration tied to semiconductor process equipment failure, low yields and cycle times, CyberOptics’ AVS 2.0 vibration monitoring software provides engineers with the data needed to predict equipment failures related to vibration during semiconductor fabrication to improve process yield and cycle times.
The AVS 2.0 software works in unison with CyberOptics’ Auto Vibration System (AVS), a wireless, wafer-like device that measures vibrations of wafer transfers in x, y and z dimensions during semiconductor processes and fabrications. Using the AVS, engineers can establish yield-based vibration standards for equipment and technicians, identify vibration sources and set acceptable acceleration parameters for equipment.
Vibration anomalies can be identified during wafer processing by filtering out acceptable vibration frequencies produced by regular slow-moving equipment or high-frequency noises between 1 to 200 Hz. The vibration monitoring software allows engineers to set low, high and band pass filters of equipment vibration frequencies to filter out vibrations of 20Hz and below and monitor vibrations of 21Hz and above to troubleshoot for vibration-related contamination. Engineers can use the AVS’ three-axis data to protect deposition uniformity and optimize yield and equipment productivity, reducing qualification time and maintenance expenses.
The newest capabilities of the AVS 2.0 vibration monitoring software include new upgrades such as enhanced trace plotting (actual graphical data representation) that improves the visual analysis of data and data exportation capabilities that support third-party applications.
Detailed information on the Auto Vibration System is available online at http://www.cyberopticssemi.com/products/wafersense/avs. A CyberOptics’ YouTube video on the AVS can be found at: http://www.youtube.com/watch?v=WVsEya1KWgA&feature=player_embedded.
Registered website users can also access a live demonstration of the AVS 2.0 software at http://www.cyberopticssemi.com/downloads/wafersense/avs/ or contact sales at (503) 495-2200 for more information.
About CyberOptics Semiconductor, Inc.
CyberOptics Semiconductor develops automated products that seamlessly measure critical parameters in semiconductor fabrication processes and equipment. The company’s pioneering WaferSense® line includes wireless metrology devices for vibration, leveling, gapping, teaching and sensing airborne particles in semiconductor process equipment. The company is the largest producer of reflective wafermapping sensors and a leading provider of frame grabber machine vision boards under its HAMA Sensors™ and Imagenation™ brands. CyberOptics Semiconductor is a subsidiary of CyberOptics Corp. (Nasdaq:CYBE), one of the world's leading providers of process yield and throughput improvement solutions for the electronic assembly and semiconductor fabrication industries. For information, visit http://www.cyberopticssemi.com/, e-mail [email protected] or call 800-366-9131.
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Posted by Lee Mather
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