Test & Measurement

Sensofar large-area metrology system features submicron height repeatability

May 19, 2020

The S Wide large-area metrology system measures sample areas up to 300 × 300 mm.

The S Wide large-area metrology system measures sample areas up to 300 × 300 mm. Features include single-button acquisition, submicron height repeatability, one-shot height measurement up to 40 mm without Z scanning, and bi-telecentric lenses with low field distortion. Systems are calibrated to ISO 25178 and VDI 2634-2 standards.

Sensofar

Terrassa, Spain

www.sensofar.com

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