Test & Measurement

Ultrafast optoelectronic probe card is customizable

Feb. 4, 2021

The UFO Probe Card is an ultrafast optoelectronic probe card used for functional testing on photonic integrated circuits.

The UFO Probe Card is an ultrafast optoelectronic probe card used for functional testing on semiconductor chips with integrated optical functions, known as photonic integrated circuits (PICs). The probe card design can be customized to meet specific requirements, such as individual PIC layout and specific test arrangement.

Jenoptik

Jena, Germany

jenoptik.com

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