The large-sample Dimension IconIR nanoscale infrared (IR) spectroscopy and chemical imaging system combines Dimension Icon AFM and nanoIR photothermal infrared atomic force microscopy (AFM-IR) technology for chemical and material property mapping with sub-10 nm chemical imaging resolution and monolayer sensitivity. This correlative microscopy solution is designed for quantitative nanochemical, nanomechanical, and nanoelectric characterization.
Bruker Nano Surfaces
Tucson, AZ
GET PRICING
LFW Staff
Published since 1965, Laser Focus World—a brand and magazine for engineers, researchers, scientists, and technical professionals—provides comprehensive global coverage of optoelectronic technologies, applications, and markets. With 80,000+ qualified print subscribers in print and over a half-million annual visitors to our online content, we are the go-to source to access decision makers and stay in-the-know.