The large-sample Dimension IconIR nanoscale infrared (IR) spectroscopy and chemical imaging system combines Dimension Icon AFM and nanoIR photothermal infrared atomic force microscopy (AFM-IR) technology for chemical and material property mapping with sub-10 nm chemical imaging resolution and monolayer sensitivity. This correlative microscopy solution is designed for quantitative nanochemical, nanomechanical, and nanoelectric characterization.
Bruker Nano Surfaces
Tucson, AZ
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