• Subscribe
  • Podcasts
  • Videos
  • Webinars
  • White Papers
  • PhotonicsNXT
  • Buyer's Guide
  • Get Published!
    1. Test & Measurement

    Thin-film metrology instrument uses two UV spectrometers

    Feb. 3, 2022
    The kSA ACE thin-film metrology instrument provides in situ monitoring of the flux and growth rate of atomic species.
    K Space Associates 61f1b0f4a6652

    The kSA ACE (Atomic Control for Epitaxy) thin-film metrology instrument provides in situ monitoring of the flux and growth rate of atomic species, using atomic absorption spectroscopy. It uses two UV-optimized solid-state spectrometers and is suited for applications in the fabrication of III-IV and II-V compounds, semiconductor devices, thin film sensors, solar cells, optical coatings, and x-ray optics.

    k-space Associates

    Dexter, MI

    k-space.com

    GET PRICING

    Continue Reading

    Sponsored Recommendations

    How to Tune Servo Systems: Force Control

    Oct. 23, 2024
    Tuning the servo system to meet or exceed the performance specification can be a troubling task, join our webinar to learn to optimize performance.

    Laser Machining: Dynamic Error Reduction via Galvo Compensation

    Oct. 23, 2024
    A common misconception is that high throughput implies higher speeds, but the real factor that impacts throughput is higher accelerations. Read more here!

    Boost Productivity and Process Quality in High-Performance Laser Processing

    Oct. 23, 2024
    Read a discussion about developments in high-dynamic laser processing that improve process throughput and part quality.

    Precision Automation Technologies that Minimize Laser Cut Hypotube Manufacturing Risk

    Oct. 23, 2024
    In this webinar, you will discover the precision automation technologies essential for manufacturing high-quality laser-cut hypotubes. Learn key processes, techniques, and best...

    Voice your opinion!

    To join the conversation, and become an exclusive member of Laser Focus World, create an account today!