White Paper: How to Improve Active Photonics Alignment Performance

Starting at wafer level, every silicon photonic chip needs to be tested. PI's Fast Multichannel Photonic Alignment (FMPA) controller algorithms were the breakthrough necessary for prober-industry leaders to deliver tools for fast and economical characterization and validation.

For Silicon Photonics (SiPh) test and assembly applications such as wafer probing, alignment time is the primary cost driver. This is true for both engineering probers and even more so for production probers, where uptime and throughput are especially critical.

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