• 673226344e486055f5a39cb8 V1 2021
    1. White Papers

    White Paper: How to Improve Active Photonics Alignment Performance

    Fast, accurate testing is a necessity for photonics industry advancements as increased chip production volumes are being driven by consumer applications such as LiDAR for cars, wearables, and mobile cameras.

    Starting at wafer level, every silicon photonic chip needs to be tested. PI's Fast Multichannel Photonic Alignment (FMPA) controller algorithms were the breakthrough necessary for prober-industry leaders to deliver tools for fast and economical characterization and validation.

    For Silicon Photonics (SiPh) test and assembly applications such as wafer probing, alignment time is the primary cost driver. This is true for both engineering probers and even more so for production probers, where uptime and throughput are especially critical.

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