Industrial materials processing, such as steel welding and micron-scale circuitry, increasingly requires expanded laser data. Thinner, back illuminated CMOS detectors and advanced calibration algorithms have enabled a new generation of beam profilers.
Lasers in industrial materials processing perform a vital function in everything from welding steel in automotive assembly to micron-scale structuring of electronic circuitry. This means an increasing need for precision, and most importantly, consistent and reliable outcomes. Traditional laser power and energy meters, while useful, can’t supply all the data needed. To meet these goals, thinner, back illuminated CMOS detectors and advanced calibration algorithms have been developed to enable a new generation of improved beam profilers.
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