Detectors & Imaging

Digital Surf acquires Image Metrology to strengthen image processing business

July 17, 2014

Digital Surf, which makes surface imaging and metrology software for microscopes and profilers, has acquired Image Metrology, a provider of nano- and microscale image processing software.

Conard Holton

Content Dam Lfw En Articles 2014 07 Digital Surf Acquires Image Metrology To Strenthen Image Processing Business Leftcolumn Article Thumbnailimage File

(Left to right) François Blateyron, COO, and Christophe Mignot, CEO of Digital Surf, Jan Friis Jørgensen, CEO, and Anders van der Aa Kühle, Technical Product Manager of Image Metrology.

Digital Surf (Besançon, France), which makes surface imaging and metrology software for microscopes and profilers, has acquired Image Metrology (Hørsholm, Denmark), a provider of nano- and microscale image processing software. Both companies will continue to operate independently under their existing management, and share software technologies and expertise.

Image Metrology will release SPIP version 6.3 in September 2014 including new software for particles and pores analysis. Digital Surf will release Mountains version 7.2 in November 2014, including new software for scanning electron microscopy. In the future Digital Surf and Image Metrology will exchange their technologies to enhance Mountains software and SPIP software. Longer term they will develop a common software platform for microscopes, profilometers, and spectrometers that is upwards compatible with both Mountains and SPIP. Both companies will recruit additional personnel to accelerate these developments.

Industrial microscopes aid precision manufacturing

Imaging spectrometers examine the world around us

Profilometer advances benefit surface analysis, film-thickness measurement

Founded in 1989, Digital Surf specializes in providing surface imaging and metrology software for all types of surface metrology instrument including 2D and 3D profilometers, optical microscopes, scanning probe microscopes, scanning electron microscopes and hyperspectral instruments. Image Metrology, founded in 1998, provides nano- and microscale image processing software.

Source: Digital Surf

About the Author

Conard Holton | Editor at Large

Conard Holton has 25 years of science and technology editing and writing experience. He was formerly a staff member and consultant for government agencies such as the New York State Energy Research and Development Authority and the International Atomic Energy Agency, and engineering companies such as Bechtel. He joined Laser Focus World in 1997 as senior editor, becoming editor in chief of WDM Solutions, which he founded in 1999. In 2003 he joined Vision Systems Design as editor in chief, while continuing as contributing editor at Laser Focus World. Conard became editor in chief of Laser Focus World in August 2011, a role in which he served through August 2018. He then served as Editor at Large for Laser Focus World and Co-Chair of the Lasers & Photonics Marketplace Seminar from August 2018 through January 2022. He received his B.A. from the University of Pennsylvania, with additional studies at the Colorado School of Mines and Medill School of Journalism at Northwestern University.