High Resolution, High Magnification to 12x UV, X-ray imaging
May 26, 2022
Related To: Star Tech Instruments
Star Tech Instruments has just released our newest products for measuring energy and beam images/profiles in the X-ray, XUV, EUV wavelengths from 1 - 410 nm.
STI now offers Instruments with NIST traceability from 5 nm to 410 nm and measurement capability down to 1 nm.
Optics
Optical Medical Imaging
Oct. 14, 2024