Auto Gapping System (AGS)

March 22, 2011
WaferSense AGS measures gaps of semiconductor processes such as thin-film deposition, sputtering and etch. This wireless system improves uniformity and increases yield through objective and repeatable gap adjustments.
By clicking above, I agree to Endeavor Business Media's Terms of Service and consent to receive promotional communications from Endeavor, its affiliates, and partners per its Privacy Notice. I also understand my personal information will be shared with the sponsor of this content, who may contact me about their offerings per their privacy policy. I can unsubscribe anytime.