Amber Czajkowski

Product Line Manager, Alluxa

Amber Czajkowski is product line manager at Alluxa (Santa Rosa, CA); she previously served as a thin-film engineer at Edmund Optics (Barrington, NJ) from 2009 through 2014.

FIGURE 1. A dual-band IR filter used to monitor climate change exhibits negligible absorption in the water band and low passband ripple.

Optics

Photonics Products: Optical Filters - Multiband coated filters redefine performance standards for scientific applications

Amber Czajkowski

June 13, 2016

Advances in thin-film technology have given rise to a new class of multiband coatings.

FIGURE 1. (a) Filter squareness is a direct function of cavity count. (b) shows repeatability of high-cavity-count-filters, with four consecutive runs of fully blocked, high-cavity-count emission filters run in two different chambers; and (c) shows blocking levels of Alluxa's high-cavity-count filters, where the noise floor on blocking measurements generally is between 60 and 80 dB.

Optics & Design

Fluorescence Imaging: Optical filtering basics for life sciences

Amber Czajkowski

Dec. 14, 2015

Optical filters can have a dramatic effect on outcomes in life sciences. These principles demonstrate how next-generation thin film enhances excitation and emission in fluorescence...

FIGURE 1. To evaluate a 785 nm Raman longpass edge filter for integration into a spectroscopy setup, the optical engineer faces three measurement challenges: confirm transmission of the passband, resolve and verify that steepness of the nearly vertical edge is OD6 @ 785 nm.

Optics

Optical Filters: Optical filter performance keeps improving-measurement techniques must keep pace

Amber Czajkowski

Jan. 16, 2015

Measuring the new generation of steep bandpass filters with bandwidths less than 1 nm tests the resolution capabilities of instrumentation; more credible measurements in these...