McPherson unveils high-energy XUV spectrometer that measures from 300 to 1 nm wavelengths

Dec. 8, 2015
Instrument is aimed at attosecond, compact EUV, and high-harmonic laser generation researchers.

McPherson (Chelmsford, MA) has announced a grazing-incidence wavelength-dispersive extreme-UV (XUV) optical spectrometer (called the model 248/310) that allows rapid analysis of spectral light at wavelengths from 300 nm all the way down to ~1 nm (4 to 1200 eV). In addition to high-harmonic laser generation experiments, the spectrometer, which has a Rowland-circle design, is useful for measuring ion- or discharge light sources, calibrating astrophysics detectors, and other uses. For example, at FLASH, the world's first soft x-ray free electron laser, which is located at Deutsches Elektronen-Synchrotron (DESY) in Hamburg, Germany, the McPherson 248/310 UHV spectrometer has assisted in analysis of the 2.3 to 4.4 nm water window (a region transparent to light).

At the Laboratory of Radiation Physics at Belgorod State University in Russia, the same model of spectrometer is being used to investigate the interaction of x-rays and fast electrons with condensed media by measuring the Cerenkov effect (in which subatomic particles traveling faster than the speed of light in a local medium produce radiation).

McPherson notes that experimental fusion reactors around the world also use the company's XUV spectrometers. McPherson also says that, when configured in reverse, the 248/310 instrument operates as a tunable light source that is useful for spectral calibration and spectroscopy in the vacuum ultraviolet (VUV), extreme UV (EUV, and soft x-ray (SXR) wavelength regions. Light is detected via direct detection CCDs, image intensifiers, microchannel plates, or electron multipliers.

The Model 248/310 ships assembled and tested for spectral resolution and with vacuum leak test certification. Adapters, differential pumping, and grazing incidence collection optics to more easily connect to the experiment can be included also. Every shipment is complete with a wavelength calibration certification, says McPherson.

For more info, see www.mcphersoninc.com.

Source: McPherson

Sponsored Recommendations

March 31, 2025
Enhance your remote sensing capabilities with Chroma's precision-engineered optical filters, designed for applications such as environmental monitoring, geospatial mapping, and...
March 31, 2025
Designed for compatibility with a wide range of systems, Chroma's UV filters are engineered to feature high transmission, superior out-of-band blocking, steep edge transitions...
March 31, 2025
Discover strategies to balance component performance and system design, reducing development time and costs while maximizing efficiency.
March 31, 2025
Explore the essential role of optical filters in enhancing Raman spectroscopy measurements including the various filter types and their applications in improving signal-to-noise...

Voice your opinion!

To join the conversation, and become an exclusive member of Laser Focus World, create an account today!