Imaging spectrometer for VUV from McPherson measures vertical spatial profile

March 28, 2018

A imaging spectrometer for the vacuum ultraviolet measures vertical spatial profile, in addition to dispersed wavelengths.

A imaging spectrometer for the vacuum ultraviolet (VUV) measures vertical spatial profile, in addition to dispersed wavelengths, to view plasma impurity emission lines from 300 to 3200 Å. Using an entrance slit width of 0.02 mm, users can achieve 15.3 pm spectral resolution FWHM. New spectrometers can be built for high vacuum (10-6 Torr) and ultra-high vacuum (10-10 Torr).

McPherson

Chelmsford, MA

www.mcphersoninc.com

Continue Reading

Optical design software: From nano to system scale

Quantum technology could aid brain tumor surgery

Sponsored Recommendations

How to Tune Servo Systems: Force Control

Oct. 23, 2024

Tuning the servo system to meet or exceed the performance specification can be a troubling task, join our webinar to learn to optimize performance.

Laser Machining: Dynamic Error Reduction via Galvo Compensation

Oct. 23, 2024

A common misconception is that high throughput implies higher speeds, but the real factor that impacts throughput is higher accelerations. Read more here!

Boost Productivity and Process Quality in High-Performance Laser Processing

Oct. 23, 2024

Read a discussion about developments in high-dynamic laser processing that improve process throughput and part quality.

Precision Automation Technologies that Minimize Laser Cut Hypotube Manufacturing Risk

Oct. 23, 2024

In this webinar, you will discover the precision automation technologies essential for manufacturing high-quality laser-cut hypotubes. Learn key processes, techniques, and best...