Imaging spectrometer for VUV from McPherson measures vertical spatial profile

March 28, 2018
A imaging spectrometer for the vacuum ultraviolet measures vertical spatial profile, in addition to dispersed wavelengths.

A imaging spectrometer for the vacuum ultraviolet (VUV) measures vertical spatial profile, in addition to dispersed wavelengths, to view plasma impurity emission lines from 300 to 3200 Å. Using an entrance slit width of 0.02 mm, users can achieve 15.3 pm spectral resolution FWHM. New spectrometers can be built for high vacuum (10-6 Torr) and ultra-high vacuum (10-10 Torr).

McPherson

Chelmsford, MA

www.mcphersoninc.com

Sponsored Recommendations

Achromatic Lenses: High-Quality Custom Optics

March 13, 2025
Ensure clarity and accuracy in your optics systems with Lacroix’s achromatic lenses. Explore how our custom solutions minimize chromatic aberration for perfect results.

Manufacturing Considerations for Tolerancing Aspheres

March 13, 2025
Understand the critical factors in manufacturing aspheres and how Lacroix Optics ensures precise tolerancing in every optical component.

Explore Our Videos: Insights into Precision Optics

March 13, 2025
Get an inside look at Lacroix Optics with our collection of informative videos showcasing our capabilities, innovations, and processes.

Optical Assemblies: Reliable and Precise Solutions

March 13, 2025
Ensure your optical system works seamlessly with Lacroix Optics' custom optical assemblies. Discover the precision and reliability we bring to every project.

Voice your opinion!

To join the conversation, and become an exclusive member of Laser Focus World, create an account today!